 |
Trust Technology Corporation |
For Sale Equipment: Measurement
Contact us via mail form or call +81-3-3344-5540 to place an order.
| TTC ID | Manufacturer | Model | Description | Vintage | QTY | Product | |
| * | 5MEAade-603-H9688 | ADE | 6034 | Measuring Instrument/Thickness | inq. | 1 | |
| * | 5MEAade-ax--N0645 | ADEX | AX-170A | Measure/Rs | Inq. | 1 | |
| * | 5MEAavi-tvs-Q7542 | Avionics | TVS-8500 | Meas: Infrared thermography | 2005 | 1 | |
| * | 5MEAbio-q8-A0986 | BIO-RAD | Q8 | Measurement/Overlay | Inq. | 1 | |
| * | 5MEAcoi-c24-P13254 | Coina | C2402B05(ID-C125MB) | Measurement: Film thickness | Inq. | 1 | |
| * | 5MEAdns-lam-Q13493 | DNS | Lambda_A VM2010 | Measuring: Optical interference film thickness/6in. | 2000 | 1 | |
| * | 5MEAdns-vl--Q0159 | DNS | VL-M6000 | Measurement/Thickness /6in. | 1993 | 1 | |
| * | 5MEAdns-vl--Q0160 | DNS | VL-M6000 | Measurement/Thickness /6in. | 1995 | 1 | |
| * | 5MEAeta-nt5-Q5785 | ETAC | NT510 | mea: Temperature cycle tester | Inq. | 1 | |
| * | 5MEAev -evg-M11917 | EV Group Europe & Asia/Pacific | EVG40NT | Measurement/Semi-Automated | Inq. | 8 | |
| * | 5MEAfis-xmd-C0904 | FISCHER | XMDVM-T7.1-W | Measurement/Thickness | Inq. | 1 | |
| * | 5MEAflu-51-Q7400 | Fluke | 51 | Meas: thermometer | Inq. | 1 | |
| * | 5MEAhel-xdl-P9675 | HelmutFischer | XDL-B | MEA:film thick test instrument | 2008 | 1 | |
| * | 5MEAhm-901-N0647 | HM | 9010 | Measure/Rs | Inq. | 2 | |
| * | 5MEAhmt-mfs-A10548 | HMT | MFS-630 | MEA:Distributed Bragg Reflector | inq | 1 | |
| * | 5MEAhoz-dt--Q7428 | Hozan | DT-510 | Meas: thermometer | Inq. | 1 | |
| * | 5MEAhp-815-P5181 | HP | 8153A | Meas: Optical Power Meter | Inq. | 2 | |
| * | 5MEAinq-le1-Q7362 | Inq. | LE12520RNN | Meas: Temperature recorder | 2000 | 1 | |
| * | 5MEAinq-tvs-Q7363 | Inq. | TVS-110 | Meas: Handy thermo | 2000 | 1 | |
| * | 5MEAkei-700-A9023 | Keithley | 7001 | Meas: Switch Control Unit | Inq. | 1 | |
| * | 5MEAkei-700-A9024 | Keithley | 7001 | Meas: Switch Control Unit | Inq. | 1 | |
| * | 5MEAkla-501-G10106 | KLA-TENCOR | 5011 | MEA:Washing | inq | 1 | |
| * | 5MEAkla-ft--H11473 | KLA-Tencor | FT-750 PRMX01 | Meas./film thickness | Inq. | 1 | |
| * | 5MEAk-m-stc-P3226 | K-Mac | STCM-7392AGL | Meas: Optical film thickness/Rs Meter+Color | 2012 | 1 | |
| * | 5MEAmet-tma-L10741 | Mettler Toledo | TMA SDTA 1 LF/1100 | Meas: Thermo-Mechanical Analyser | 2014 | 1 | |
| * | 5MEAnan-nan-H11472 | NANOMETRICS | NANOSPEC VT-210 | Meas./film thickness | Inq. | 1 | |
| * | 5MEAnap-rt--H9689 | NAPSON | RT-70V | Mea:Resistivity meter | inq. | 2 | |
| * | 5MEAnap-rt--P9674 | NAPSON | RT-70 | MEA:resistivity meter | 1990 | 1 | |
| * | 5MEAnor-lms-8979 | North Sutton NH | LMS-050CM | Meas: Labsphere | Inq. | 1 | |
| * | 5MEAoly-ar2-P3232 | Olympus | AR2060 | Measure: Line width/MCD | 2012 | 1 | |
| * | 5MEApro-ft--A13133 | PROMETRIX | FT-530 | Meas./Thickness test | Inq. | 1 | |
| * | 5MEArud-met-F11313 | RUDOLPH | metapulse@200 mm | Measuring instrument/Metal film thickness | 2003 | 1 | |
| * | 5MEArud-mp3-A2901 | Rudolph | MP300 | Meas./Thickness | Inq. | 1 | |
| * | 5MEArud-mp3-A5669 | Rudolph | MP300 | Meas./film thickness 12in. | Inq. | 1 | |
| * | 5MEArud-spe-Q13529 | Rudolph | SpectraLASER 200 XL | Measurement: Thickness | 1999 | 1 | |
| * | 5MEAsci-fil-A10547 | SCI | FilmTek 1000 | MEA:Filmtek | inq | 1 | |
| * | 5MEAsha-mod-Q6503 | SHAW | MODEL SHA | meas: Dew point meter | 1991 | 1 | |
| * | 5MEAsks-sk--Q7457 | skSATO | SK-1100/SK-K010 | Meas: thermometer | Inq. | 1 | |
| * | 5MEAsks-sk--Q7458 | skSATO | SK-1250MCⅢ | Meas: thermometer | Inq. | 1 | |
| * | 5MEAtek-lx4-8978 | TEKNOLOGUE | LX4670B | Meas: Control Unit | Inq. | 1 | |
| * | 5MEAthe-tp5-Q13528 | Therma-wave | TP500 | meas: Therma probe | 1997 | 1 | |
| * | 5MEAysy-ywa-A10740 | Ysystems | YWAFER Mapper GS2 | Meas: PL Mapper/2-4in | 2006-2010 | 2 |
© Copyright 2005-2024 (TTC Group) Trust Technology Corporation. All Rights Reserved.