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Trust Technology Corporation |
For Sale Equipment: Inspection
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| TTC ID | Manufacturer | Model | Description | Vintage | QTY | Product | |
| * | 5INSadv-r31-K11985 | Advantest | R3132 | Ins: Spectrum Analyzer | 2001 | 1 | |
| * | 5INSagi-750-Q12676 | Agilent | 7500 series | insp: ICP-MS | Inq. | 1 | |
| * | 5INSaug-cv--A13161 | AUGUST | CV-9800 | Inspection: Wafer Carrier | Inq. | 1 | |
| * | 5INScam-fal-H12802 | Camtek | Falcon 620plus | Inspection: Wafer AOI | 2008 | 1 | |
| * | 5INSchr-190-V3941 | Chroma | 19073 | Inspection: Pressure tester | Inq. | 1 | |
| 5INSchr-inq-V3937 | Chroma | Inq. | Inspection: Pressure tester | Inq. | 1 | ||
| * | 5INScmi-sap-G12720 | CMIt | SAPPAS -V5-plus | Insp: PSS AOI | 2016 | 2 | |
| * | 5INScmi-sap-G12721 | CMIt | SAPPAS-V7 | Insp: PSS AOI | 2018 | 1 | |
| * | 5INSdat-bms-P13336 | DATARAY | BMS2-4XY | Insp: Slit beam profiler/Beam map | 2017 | 1 | |
| * | 5INSdkl-ru--R0168 | DKL | RU-700 | Inspection: Review/Defect | 1995 | 1 | |
| * | 5INSeik-l00-Q8309 | EIKO007/909 | L0011Lamp.115V.PTC | Insp: EpimetⅡ lamp/125V 250W | Inq. | 20 | |
| * | 5INSeld-xl8-C0526 | ELDIM S.A. | XL88 | Ins: Contrast Machine | 2006 | 1 | |
| * | 5INSele-lf -E12980 | Eleven electron | LF AOI | Inspection : Full-Auto L/F & Mold | 2021 | 1 | |
| * | 5INSgen-cl--Q10046 | Gentec-EO/thorlabs | CL-25/MVL50M23 | INS:Beam profiler/Beamage-4M | 2017 | 1 | |
| * | 5INSham-c93-E4962 | Hamamatsu | C9334-01etc | Ins: FFP measurement unit | Inq. | 1 | |
| * | 5INShit-ls--Q12835 | Hitachi | LS-6030 | Inspection: Wafer Surface Inspection System | 1994.12 | 1 | |
| * | 5INShit-pd--K8040 | Hitachi | PD-2000 | Inspection: Reticle Surfscan | 1989 | 1 | |
| * | 5INShit-u-2-Q6855 | Hitachi | U-2000 | Insp: spectrophotometer | Inq. | 1 | |
| * | 5INShit-u-2-Q6856 | Hitachi | U-2010 | Insp: spectrophotometer | Inq. | 1 | |
| * | 5INShit-wi--Q0156 | HITACHI | WI-890 | Inspection/Wafer Visual /6in. | 1997 | 1 | |
| * | 5INShit-z-5-Q6852 | Hitachi | Z-5310 | Insp: spectrophotometer/flame | Inq. | 1 | |
| * | 5INShit-z-5-Q6853 | Hitachi | Z-5010 | Insp: spectrophotometer/Zeeman | Inq. | 1 | |
| * | 5INShor-ema-R0169 | Horiba | EMAX-5770 | Inspection: X-ray Microanalyxer | 1995 | 1 | |
| * | 5INShp-406-A5559 | HP | 4062UX | Insp: Parametric Tester | Inq. | 1 | |
| * | 5INSinq-inq-Q11838 | Inq. | Inq. | Inspection: Wafer/4in. | Inq. | 1 | |
| * | 5INSjai-jhs-Q8597 | JAI | JHS-100 | Insp.: Purge & Trap Sampler | Inq. | 1 | |
| * | 5INSjds-rm3-P5183 | JDSU | RM3750 | Ins: Optical Back Reflection Meter | Inq. | 1 | |
| * | 5INSkey-cv--Q7586 | Keyence | CV-X290A | Insp: vision sensor | 2018 | 2 | |
| * | 5INSkla-213-A13001 | KLA-Tencor | 2132 | Inspection: Defect/6in. | Inq. | 1 | |
| * | 5INSkla-213-A13158 | KLA-Tencor | 2133 | Inspection: Defect | Inq. | 1 | |
| * | 5INSkla-260-A13159 | KLA-Tencor | 2608 | Inspection: Defect | Inq. | 1 | |
| * | 5INSkla-750-A11141 | KLA | 7500 | Inspection: Surfscan | Inq. | 1 | |
| * | 5INSkla-760-A6256 | KLA-TENCOR | 7600 | Inspection: Surfscan | Inq. | 2 | |
| * | 5INSkla-alt-P13255 | KLA-Tencor | Altair 8900 | Inspection: Wafer | 2014 | 1 | |
| * | 5INSkla-can-A10318 | KLA | Candela CS10R | Inspection equipment | inq | 1 | |
| * | 5INSkla-can-A13478 | KLA Tencor | Candela8720 | Inspection: Surface Defect/4-6in | 2017 | 1 | |
| * | 5INSkla-can-G12093 | KLA Tencor | Candela CS10R | Inspection/Defect | Inq. | 1 | |
| * | 5INSkla-ci--Ⅴ10037 | KLA/ICOS | CI-T620 | Inspector | 2014 | 1 | |
| * | 5INSkla-cs9-A10210 | KLA Tencor | CS920 | Inspection device | 2015 | 1 | |
| * | 5INSkla-edr-A13316 | KLA | eDr7280 | Inspection: E-Beam Wafer Defect Review | Inq. | 1 | |
| * | 5INSkla-es3-P6171 | KLA / TENCOR | eS32 | Inspection: Electron-beam/ Wafer | 2007 | 1 | |
| * | 5INSkla-es--A5672 | KLA | ES-32 | Inspection: Surface/12in. | Inq. | 1 | |
| * | 5INSkla-ico-P13256 | KLA-Tencor | ICOS WI-2280(Chamber&Handler) | Inspection: Wafer | 2013 | 1 | |
| * | 5INSkla-kla-G10105 | KLA-TENCOR | KLA-5500 | Inspection system | inq | 1 | |
| * | 5INSkla-kla-G12514 | KLA Tencor | KLA2135 | Inspection/Defect | Inq. | 1 | |
| * | 5INSkla-kla-P10886 | KLA Tencor | KLA-HRP-P350 | INS:Profile meter | 2009 | 1 | |
| * | 5INSkla-sfs-A11947 | KLA-Tencor | SFS 6420 | insp: Particle inspection/ 8in. | 1995 | 1 | |
| * | 5INSkla-sfs-A6671 | KLA-Tencor | SFS 7700 | insp: Particle inspection system | 1994-1996 | 4 | |
| * | 5INSkla-sfs-P6300 | KLA-Tencor | SFS6200 | Inspection: Defect | Inq. | 1 | |
| * | 5INSkla-sur-A5552 | KLA | SURFSCAN 7700 | Inspection: Particle Analyzer | Inq. | 1 | |
| * | 5INSkla-ten-A13156 | KLA-Tencor | TENCOR 7700M | Insp.: Partical Inspection | Inq. | 1 | |
| * | 5INSkla-ten-A13157 | KLA-Tencor | TENCOR 7700 | Insp.: Partical Inspection | Inq. | 1 | |
| * | 5INSkla-zet-G12723 | KLA | ZETA-300 | Insp: Optical profiler/3D | 2016 | 1 | |
| * | 5INSkla-zet-G12724 | KLA | ZETA-200 | Insp: Optical profiler/3D | 2010 | 1 | |
| * | 5INSkon-cs--S4414 | Konica Minolta | CS-2000A | Insp: Spectroradiometer | 2014 | 1 | |
| * | 5INSlei-mis-A0985 | Leica | MIS-200 | Inspection/Defect | Inq. | 1 | |
| * | 5INSmit-m-p-E11165 | Mitutoyo | M-Plan Apo 5X | INS:microscope objective lens | inq. | 1 | |
| * | 5INSmit-m-p-E11166 | Mitutoyo | M-Plan Apo 10X | INS:microscope objective lens | inq. | 1 | |
| * | 5INSmit-m-p-E11167 | Mitutoyo | M-Plan Apo 20X | INS:microscope objective lens | inq. | 1 | |
| * | 5INSmit-m-p-E11168 | Mitutoyo | M-Plan Apo SL50X | INS:microscope objective lens | inq. | 1 | |
| * | 5INSnag-nlx-Q13109 | Nagoya | NLX-2500FAM | Insp: X-Ray Inspection System | 2004 | 1 | |
| * | 5INSnan-rpm-A13205 | Nanometrics | RPM 2000 | insp: Photoluminescence Mapper | 2001 | 1 | |
| * | 5INSnew-708-P5186 | Newport | 708 8-Channel | Ins: Butterfly Fixture | Inq. | 2 | |
| * | 5INSnic-eco-A10917 | Nicolet | ECO-8S | INS:SPECTROMETERS | inq. | 1 | |
| * | 5INSnik-gp--Q10041 | Nikka | GP-1-T | INS:Goniophotometer | 2016 | 1 | |
| * | 5INSnik-nwl-P12754 | Nikon | NWL-860 | Inspection: wafer | Inq. | 1 | |
| * | 5INSnik-opt-A13154 | Nikon | OPTISTION-3 | Inspection: ADI | Inq. | 3 | |
| * | 5INSnik-opt-A6257 | NIKON | OPTISTATION-3A | Inspection: Wafer | Inq. | 4 | |
| * | 5INSnik-opt-P13015 | Nikon | OPTISTATION-3100 | Inspection: wafer | 2010 | 1 | |
| * | 5INSnik-xt -M13510 | Nikon | XT V 160 | Insp: X-Ray Inspection System | 2014 | 4 | |
| * | 5INSnor-x2.-M12398 | Nordson | X2.5 | Insp: Auto X-Ray Inspection System | Inq. | 1 | |
| * | 5INSnor-xnc-M12396 | Nordson | XNC-S600 | Insp: Auto X-Ray Inspection System | Inq. | 1 | |
| * | 5INSnor-xnc-M12397 | Nordson | XNC-V600 | Insp: Auto X-Ray Inspection System | Inq. | 1 | |
| * | 5INSnor-ytx-M12451 | Nordson | YTX-X2 | Insp: Auto X-Ray Inspection System | Inq. | 1 | |
| * | 5INSorc-mem-E13541 | ORC | MEM-5296D | insp: Bump height measurement system | Inq. | 1 | |
| * | 5INSosi-met-A5561 | OSI | METRA 2100m | Inspection: Overlay/6" | Inq. | 1 | |
| * | 5INSosi-met-A5562 | OSI | METRA II | Inspection: Overlay/6" | Inq. | 1 | |
| * | 5INSoxf-azt-A4595 | oxford | Aztec X-Max 80T | Insp: EDS for TEM | 2016 | 1 | |
| * | 5INSpar-3d--G11826 | PARMI | 3D-XCEED | Inspection: AOI | Inq. | 1 | |
| * | 5INSper-lam-P5176 | Perkin Elmer | Lambda 900 | Ins: Spectrometer | Inq. | 1 | |
| * | 5INSper-sim-A5678 | PerkinElmer | SIMAA6000 | Ins: Atomic absorption spectrometer | Inq. | 1 | |
| * | 5INSphi-ir3-A5670 | Philips | IR3100 | Ins: Infrared depth measuring systems/12in. | Inq. | 2 | |
| * | 5INSrsv-ws--P9029 | RSVI Inspection | WS-3800 | Inspection: wafer | 2008 | 1 | |
| * | 5INSrud-nsx-A9992 | Rudolph | NSX320 | INS:AOI | 2017 | 1 | |
| * | 5INSrud-nsx-G12510 | RUDOLPH | NSX100 | Inspection/Defect/6in | Inq. | 1 | |
| * | 5INSrud-nsx-L12820 | Rudolph / August | NSX-85 | Insp: Automated Defect Inspection System | Inq. | 1 | |
| * | 5INSsan-mi--R0165 | SANWA | MI-476 | Inspection: Oxide Film Evaluation Tool | Inq. | 1 | |
| * | 5INSsan-sx--L0412 | Sanseidenshi | SX-5187 | Inspection/Temperature /SMD Quartz | Inq. | 1 | |
| * | 5INSsci-300-Q9961 | Scitec instruments | 300CD | Insp: Optical chopper | inq | 1 | |
| * | 5INSsci-420-Q9960 | Scitec instruments | 420 | Insp: lock-in amplifier | inq | 1 | |
| * | 5INSsec-x-e-G7721 | SEC | X-EYE 3000A | Inspection machine | 2007 | 1 | |
| * | 5INSsei-sea-C0807 | Seiko | SEA1000A | Inspection: XRF | Inq. | 1 | |
| * | 5INSshi-edx-Q8842 | Shimazu | EDX-800HS2 | Inspection: EDX | Inq. | 1 | |
| * | 5INSshi-uv--Q9883 | Shimadzu | UV-2400 | INS:spectrophotometer | inq | 2 | |
| * | 5INSsof-sfx-L11359 | SOFTEX | SFX-90 | Inspection:X-RAY | 2018 | 1 | |
| * | 5INSspt-inq-F11314 | SPTS | inq. | INS:APM process module | 2011 | 1 | |
| * | 5INSsur-ys--L12808 | SURUGA SEIKI | YS-1100 | Insp: YAG Welding Alignment System | Inq. | 1 | |
| * | 5INStos-tos-S4405 | Toshiba itc | TOSMICRON 6130FP | Inspection:X-ray | Inq. | 1 | |
| * | 5INSvis-lds-A1328 | Vistec | LDS3300M | Inspection/Defect | Inq. | 1 | |
| * | 5INSvis-lds-A5671 | Vistec | LDS3300M | Inspection: Surface/12in. | Inq. | 1 | |
| * | 5INSvj -ver-L12430 | VJ Electronix | Vertex II Model V90 | Inspection system: X-Ray | 2017 | 1 | |
| * | 5INSyok-aq2-Q7519 | Yokogawa | AQ2105 | Ins: Multi meter | 1988 | 1 | |
| * | 5INSzei-a30-M11014 | ZEISS | A300 | INS:Optical Equipment | inq. | 1 |
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